1-1-4 (03h): BIOS ROM checksum failure
1-2-1 (04h): Programmable interval timer test failure
1-2-2 (05h): DMA initialization failure
1-2-3 (06h): DMA page register write/read test failure
1-3-1 (08h): RAM refresh verification failure
1-3-3 (0Ah): 1st 64K RAM chip or data line failure - multi-bit
1-3-4 (0Bh): 1st 64K RAM odd/even logic failure
1-4-1 (0Ch): 1st 64K RAM address line failure
1-4-2 (0Dh): 1st 64K RAM parity test in progress or failure
2-1-1 (10h): 1st 64K RAM chip or data line failure - bit 0
2-1-2 (11h): 1st 64K RAM chip or data line failure - bit 1
2-1-3 (12h): 1st 64K RAM chip or data line failure - bit 2
2-1-4 (13h): 1st 64K RAM chip or data line failure - bit 3
2-2-1 (14h): 1st 64K RAM chip or data line failure - bit 4
2-2-2 (15h): 1st 64K RAM chip or data line failure - bit 5
2-2-3 (16h): 1st 64K RAM chip or data line failure - bit 6
2-2-4 (17h): 1st 64K RAM chip or data line failure - bit 7
2-3-1 (18h): 1st 64K RAM chip or data line failure - bit 8
2-3-2 (19h): 1st 64K RAM chip or data line failure - bit 9
2-3-3 (1Ah): 1st 64K RAM chip or data line failure - bit A
2-3-4 (1Bh): 1st 64K RAM chip or data line failure - bit B
2-4-1 (1Ch): 1st 64K RAM chip or data line failure - bit C
2-4-2 (1Dh): 1st 64K RAM chip or data line failure - bit D
2-4-3 (1Eh): 1st 64K RAM chip or data line failure - bit E
2-4-4 (1Fh): 1st 64K RAM chip or data line failure - bit F
3-1-1 (20h): Master DMA register test failure
3-1-2 (21h): Slave DMA register test failure
3-1-3 (22h): Master interrupt mask register test failure
3-1-4 (23h): Slave interrupt mask register test failure
3-2-4 (27h): Keyboard controller test failure
3-3-4 (2Bh): Screen memory test failure
3-4-1 (2Ch): Screen initialization failure
3-4-2 (2Dh): Screen retrace test failure
4-2-1 (34h): Timer tick interrupt test failure
4-2-2 (35h): Shutdown test failure
4-2-3 (36h): Gate A20 failure
4-2-4 (37h): Unexpected interrupt in protected mode
4-3-1 (38h): RAM test failure above address 0FFFFh
4-3-3 (3Ah): Interval timer channel 2 test failure
4-3-4 (3Bh): Time-Of-Day clock test failure
4-4-1 (3Ch): Serial port test failure
4-4-2 (3Dh): Parallel port test failure
4-4-3 (3Eh): Math coprocessor test failure